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Our LSC-4000 Series Advanced Defect Inspection System is a top ranked inspection system often adopted in the optical and functional film fields.
Characteristics:
-CameraLink 160 MHz camera allows for high-speed, high-resolution inspection
-Each image processing board can be linked with two cameras
-Comes equipped standard with 2DF, required for high-performance
-32 bit processing allows for differentiating intensity variation of less than 0.1%
-Greater than 10x defect inspection capability (MEC comparison)
-Greater than 5x defect image capture capability (MEC comparison)
“Fine Monitor”: Defect Imaging Monitoring Unit
-Revolutionary device that can capture, display, and store magnified images of defects in real time
-Able to capture images with a resolution of under 5 μm
-Can be added to existing LSC Series equipment
-Dramatically improves quality management at the site of production
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Contact Information：
1-12-30 Shimoimaizumi, Ebina, Kanagawa 243-0435 Japan
TEL.+81-46-292-0077 FAX.+81-46-292-0010
Email：
URL：http://www.mec-ins.co.jp/
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Sales Office：
Products：
Line CCD Defect Inspection System, Optical Inspection Equipment, Fiber Optic Lighting and Optical Related Products
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